LED Burn-In Test
Burn-In System for up to 80 DUTs in climatic chamber
Application Description
Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.
The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
Special Features
By using inexpensive LXI-based power supplies, it was possible to implement a separate supply for each DUT channel, with support for current and voltage measurements.
Customer-specific Software
The software for the burn-in system was universally developed based on customer project requirements and is available for future burn-in applications. According to the customer's request, the application software was entirely developed in NI LabView.
| LX-TSCOE4 Operator Interface... | |
| LX-TSCOE Legacy OP | |
| LX-Test Database... | |
| LX-Magpie Evaluation Software... | |
| LX-Woodcreeper Database API... | |
| NI TestStand... | |
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| Associated Research Autoware | |
| LX-Test Step-Library | |
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| ✓ | NI LabVIEW... |
| Keysight VEE... |