Burn-in and run-in systems
Test engineers typically have to meet 3 main challenges with burn-in-tests.
Electrical Contacting of DUTs
The concurrent electrical adaption of many DUTs, preferably without any negative influence on the airflow by conditioned air. The test adaptation should also have some thermal capacity, so that the temperature of the adaptation can be controlled with as little heating and cooling power as possible.
Another important design point is the use of electrical leads which are designed for continuous operation under extreme climatic conditions.
The DUT power supply has to be designed in such a way that a failure of the DUT, e. g. a short circuit, will not lead to faulty test results of all DUTs in the climate chamber. Often, it will not be possible to simply repeat the test, because this would excessively stress or even damage the DUT. It is therefore common practice to separate the DUTs into clusters and to power them via modular power supplies with several output channels.
Parallel testing requires test software with a specific functionality. With our burn-in systems, the test application will only be written for one DUT; it can then be reused for testing various DUTs via the “Multiple Up” functions of the test sequencer.
The operator interface of our burn-in system is basically identical to the TSCOE4, but the user interface has been adapted for visualizing simultaneous tests of multiple DUTs. The applicable climate profiles are then processed as sequences by the operator interface; they can be defined independently by the DUT-specific test application.
The test results are automatically assigned to the individual DUTS and stored in our MySQL test database.