PICOPROBE® Microwave Probes | 40-110 Series
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Product Information "PICOPROBE® Microwave Probes | 40-110 Series"
PICOPROBE® 40-110 Series
Microwave Probes for HF Wafer Probing
On-Wafer Measurements, and RF Characterization
Coaxial microwave probes for precise on-wafer measurements
The PICOPROBE® 40-110 Series from GGB Industries comprises high-precision coaxial microwave probes, designed for demanding HF wafer probing and reliable on-wafer measurements.
The application range extends from high-frequency to microwave and millimeter-wave measurement technology.
Precise electrical contact to wafers and substrates forms the basis for stable and comparable measurement results, particularly for S-parameter analysis and other HF measurement tasks.
Flexible integration into laboratory and wafer test environments
The PICOPROBE® Series supports both manual laboratory setups and automated wafer test systems. Integration into existing probe stations is straightforward, and common contact geometries for direct on-wafer measurements are reliably supported.
Coaxial design for reproducible on-wafer measurements
The patented coaxial design ensures controlled signal guidance up to the probe tip and reduces losses as well as radiation effects compared to non-coaxial contact concepts. Individually spring-loaded contacts provide a secure electrical connection even on uneven (non-planar) wafer surfaces. Direct visual access to the probe tips facilitates precise positioning and supports a reproducible measurement setup.
Your benefits at a glance
- coaxial microwave probes for precise HF wafer probing
- reproducible on-wafer measurements in development and characterization
- stable signal guidance for comparable HF and microwave analyses
- flexible integration into laboratory and wafer test environments
We are happy to support you in selecting the appropriate PICOPROBE® 40-110 Series microwave probe for your measurement task.
Contact us for technical consultation and further information.
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Features & Technical Data of the Microwave Probes PICOPROBE® 40-110 Series
PICOPROBE® 40-110 – Model-Independent Features & Technical Data:
- Coaxial microwave probes for precise HF, microwave, and millimeter-wave wafer probing
- Patented coaxial design ensures controlled and stable signal transmission
- Individually spring-loaded contacts provide reliable on-wafer contact
- Enable reliable measurements even on uneven (non-planar) wafer surfaces
- Direct visual access to the probe tips supports precise positioning
- Support flexible integration into manual and automated probe stations
- Measurement principle: coaxial signal transmission up to the probe tip
- Contact material: beryllium copper, optional tungsten or nickel (model-dependent)
- Contact geometries: GSG, GS, SG
- Application range: on-wafer measurements in HF, microwave, and millimeter-wave applications
Model 40A – Model-Specific Features & Technical Data:
- Optimized for development and production measurements with very high repeatability
- Particularly suited for automated wafer testing, probe cards, and multi-contact wedges
- Available with optional tungsten or nickel probe tips
- Offer high flexibility through custom adapters and mounting solutions
- Frequency range: DC to 40 GHz
- RF connector: 2.92 mm K connector (compatible with 3.5 mm / SMA)
- Pitch (tip spacing): 25 µm to 2540 µm
- Measurement repeatability: very high (suitable for series and production testing)
Model 50A – Model-Specific Features & Technical Data:
- Designed for high-end HF and microwave measurements with increased bandwidth
- Focus on maximum signal integrity at higher frequencies
- Preferred choice for demanding laboratory and characterization applications
- Frequency range: DC to 50 GHz
- RF connector: 2.4 mm connector (V-compatible)
- Pitch (tip spacing): available from 25 µm
- Measurement repeatability: high
Model 67A – Model-Specific Features & Technical Data:
- Designed for advanced RF applications beyond conventional HF ranges
- Suitable for on-wafer measurements in the millimeter-wave range
- Primary use in advanced development and research environments
- Frequency range: DC to 67 GHz
- RF connector: 1.85 mm V connector (compatible with 2.4 mm)
- Pitch (tip spacing): 50 µm to 1250 µm
- Measurement repeatability: high
Model 110H – Model-Specific Features & Technical Data:
- Developed for on-wafer measurements at the highest millimeter-wave frequency ranges
- Used in research, development, and high-end characterization applications
- Suitable for millimeter-wave ICs and W-band structures
- Frequency range: DC to 110 GHz
- RF connector: 1.0 mm connector
- Pitch (tip spacing): 50 µm to 1250 µm
- Measurement repeatability: very high (mmWave-optimized)
Options and Accessories for the Microwave Probes PICOPROBE® 40-110 Series
- Adapters and probe holders for standard microwave probe stations
- Mounting hardware for probe cards and multi-contact wedges
- Custom mechanical mounts for special setups and confined installation spaces
- Waveguide interfaces / waveguide adapters for applications at very high frequency ranges (model-dependent)
- Optional integrated Bias-T for measurements on active devices (available only with waveguide versions)
Note:
Available accessories depend on the specific model and application. Some extensions are provided as custom solutions and are available on request.
Our team will be happy to support you in selecting suitable accessories and extensions for your PICOPROBE® application.
Scope of Delivery of the Microwave Probes PICOPROBE® 40-110 Series
The standard scope of delivery includes the selected PICOPROBE® 40-110 Series microwave probe in the ordered configuration.
Application Possibilities and Examples for the Microwave Probes of the PICOPROBE® 40–110 Series
Cross-Model Applications:
- RF wafer probing for active and passive components
- On-wafer measurements for development, characterization, and research
- S-parameter analyses and frequency-dependent RF measurement tasks
- Measurements on wafers, substrates, and test structures
- Use in manual and automated probe stations
- Characterization of RF, microwave, and millimeter-wave components
- Reproducible measurements enabled by coaxial probe design
- Precise contact even on uneven (non-planar) wafer surfaces
Model 50A – Model-Specific Applications:
- High-end RF and microwave measurements in laboratory environments
- Precise S-parameter measurements at higher frequencies
- Characterization of RF ICs, MMICs, and passive RF structures
- Validation and optimization of RF circuits and layouts
- Research and development applications with high signal integrity requirements
Model 67A – Model-Specific Applications:
- Advanced RF applications beyond traditional RF and microwave ranges
- On-wafer measurements in the millimeter-wave frequency range
- Characterization of modern RF ICs and MMICs with extended frequency requirements
- Technology and platform development for future mmWave applications
- Research-oriented measurement tasks in advanced development environments
Model 110H – Model-Specific Applications:
- On-wafer measurements at the highest millimeter-wave frequency ranges
- Characterization of mmWave ICs, W-band and sub-THz structures
- Research and development applications in universities and industrial R&D
- Validation of novel semiconductor technologies and component concepts
- High-frequency component and material characterization