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PXIe Device Power Supply | GX3116e

PXIe Device Power Supply | GX3116e
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  • MV-GX3116e
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Marvin Test Solutions GX3116e PXIe | 16 Channel Device Power Supply (DPS) The GX3116e Device... more
Product information "PXIe Device Power Supply | GX3116e"

Marvin Test Solutions GX3116e
PXIe | 16 Channel Device Power Supply (DPS)

The GX3116e Device Power Supply (DPS) delivers the highest density, most flexible, isolated semiconductor device power supply solution available. Each of the 16 independent, isolated, power supply channels provides four-quadrant functionality, making this the ideal solution for many existing and emerging multisite semiconductor test applications. Greatly exceeding the capabilities of commonly available DPS instrumentation, the ability to force voltage/measure current (FV/MI) and force current/measure voltage (FI/MV) on an individual channel basis provides exceptional flexibility, and simplifies test system expansion by supporting hundreds of channels in 16 channel increments.

The GX3116e is a precision 16-channel Device Power Supply (DPS) capable of forcing and measuring both voltage and current on all 16 channels independently. It incorporates two electrically isolated groups of 8 programmable voltage/current source and measurement channels. Three programmable current ranges are available: 2.56 mA, 25.6 mA and 512 mA; the voltage output range is determined by the current range selection. In low current ranges the DPS can force between -2 V and 10.5 V, and in high current mode (>512 mA), the DPS can force between 0 V and 9.0 V. Multiple channels can be ganged together to achieve higher current levels, with a maximum current output of 2 A per bank; additionally, both banks can be ganged together to extend the total available output current to 4 A.

In constant voltage mode, the DPS forces a voltage whose current output is determined by the programmable source/sink current limits. The output voltage can be sensed either locally or remotely utilizing Kelvin connections available on a per channel basis. Kelvin connections provide the best voltage accuracy at the device under test (DUT), ensuring that the DUT receives the required excitation levels independent of cabling and other interconnects. Each channel has a ground sense which can be connected to local ground or to the DUT ground. The ground sense, when connected to the DUT, is capable of tracking the DUT ground level and adjusting its output accordingly for additional configuration flexibility.

In constant current mode the DPS forces a current, and the voltage output is limited by programmable high/low voltage limits. Output voltage and current levels are set with 16 bits of resolution, and measurement readback with 24 bits of resolution. Each channel can be protected and disabled when an over current, over voltage or over temperature condition is detected.

The instrument is supplied with the GXSMU software package that includes a virtual instrument panel, and a Windows 32/64-bit DLL driver library and documentation. The virtual panel can be used to interactively program and control the instrument from a window that displays the instrument’s settings and status. Interface files are provided to support access to programming tools and languages such as ATEasy, LabView, LabView/Real-Time, C/C++, C#, Microsoft Visual Basic®, Delphi, and Pascal. An On-Line help file and a PDF User's Guide provides documentation that includes instructions for installing, using and programming the board. A separate software package, GtLinux, provides support for Linux 32/64 operating systems.

Applications of the PXIe GX3116e

  • Semiconductor component test and characterization
  • ATE board and system level test

Specifications of the PXIe GX3116e

  • 16 Independent DPS Channels
  • -2 V to +10.5 V Programmable per Channel
  • Up to ±512 mA Full Scale per Channel
  • Parallel Current Ganging up to 4 A per Card
  • Kelvin Connection Sensing per Channel
  • Over-current/voltage Sensing / Alarm per Channel
  • External Trigger / Synchronization
  • PXI Express / Hybrid Slot compatible
  • Temperature Range Operating: 0 to +55 °C
  • Storage: -20°C to +70 °C
  • I/O Connector DB 25, female
  • Format PXIe, 3U single slot, hybrid slot compatible

Marvin Test Solutions ist ein amerikanischer Hersteller für PXI Instrumente und Software für Funktionstestsysteme und Halbleitertest.

  • Eine besondere Stärke von Marvin Test Solutions sind schnelle digitale Pattern-I/O Karten, FPGA- und SMU Karten im 3U und 6U PXI Formfaktor.
  • Neben Einzelkomponenten liefert Marvin auch vorkonfigurierte Funktionstestsysteme und Halbleitertestsysteme.
  • Mit der ATEasy Entwicklungsumgebung bietet Marvin Kunden, die eine eigene Testsoftware-Architektur realisieren wollen, einen leistungsfähigen Baukasten inkl. integrierter Sequenzerfunktionen.

LXinstruments vertreibt Produkte von Marvin Test Solutions in Deutschland, Österreich und der Schweiz.

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