Agil eFuse2 | Electronic fuse
Protects wafer probes, bias tees, and DUTs from overcurrent damage with ultra-fast shutdown – ideal for safe on-wafer and semiconductor testing.
- ✓ Electronic fuse for on-wafer test
- ✓ protection for wafer probes / bias tees / connectors and the transistors
€2,100.00
% Regular price: €2,340.00 (10.26% saved)Prices plus VAT plus shipping costs
Electronic fuse for on-wafer test, protection for wafer probes, bias tees, connectors and the transistors
Agil eFuse2: The Electronic Fuse
To characterise transistors during development, on-wafer measurements (of sub-cells) are an indispensable tool. Typical DC voltages that need to be applied to the test wing certainly exceed voltages of 50 V and currents of up to 10 A. Large power supplies are needed, with a high amount of stored energy. When approaching the limits of the transistor, the set current limits are often not properly maintained and the transistors are destroyed during critical measurements. The devices, such as probe tips, can also be affected. With the Agil eFuse2 you can very easily protect wafer probes, bias tees, connectors and regularly also the transistors themselves.
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Would you like to reliably protect your wafer probes and DUTs from overcurrent?
We can help you select and integrate the eFuse2 for safe on-wafer and semiconductor testing – tailored to your specific measurement application.
Specifications
| Electronic fuse | |
| 200V | |
| 10A | |
| 115V or 230V | |
| Switch-off time < 300 ns | |
| Supply for the range 0..10 A optional | |
| Voltage up to 200 VDC (also 100 VDC available) | |
| Various connections are possible. | |
| Low transmission losses (50mΩ) | |
| RS232 interface for operating information | |
| All important controls on the front panel | |
| Display W, mW, µW, dBm, db |
Links & Downloads
Supplier
AGIL steht für Analoge und Getaktete Industrielle Leistungselektronik. Der Name dieses kleinen, deutschen Spezialisten für individuelle Stromversorgungslösungen ist Programm. Die bsw hat exklusiv die Familie der efuses im Vertrieb. Die efuse ist keine Sicherung im bekannten Sinn, sondern eine hochschnelle elektronische Schaltung, die im On-wafer- bzw. Halbleitertest verwendete Messspitzen schneller abschalten kann, als ein Kurzschluss die Messspitze und den Prüfling schädigt.