PICOPROBE 40-110 | Microwave Probes
Precise, repeatable on-wafer RF measurements up to 110 GHz thanks to the coaxial design and reliable contact.
- ✓ High-Performance Microwave Probes for HF Measurements
- ✓ from DC 40 to 110 GHz
- ✓ Coaxial Design
- ✓ Spring-Loaded Contacts
Microwave Probe Tips for RF Wafer Probing, On-Wafer Measurements and RF Characterization
PICOPROBE 40-110: Coaxial Microwave Probe Tips for Precise On-Wafer Measurements
The PICOPROBE® 40-110 Series from GGB Industries includes high-precision coaxial microwave probe tips developed for demanding RF wafer probing and reliable on-wafer measurements. The application range extends from high-frequency and microwave technology to millimeter-wave measurement technology. Precise electrical contacting of wafers and substrates provides the basis for stable and comparable measurement results, especially in S-parameter analysis and other RF measurement tasks.
Flexible Integration Into Lab and Wafer Test Environments
The PICOPROBE® 40-110 Series is suitable for manual laboratory setups as well as automated wafer test systems. Integration into existing probe stations is straightforward, and common contact geometries for measurements directly on the wafer are reliably supported.
Coaxial Design for Reproducible On-Wafer Measurements
The patented coaxial design ensures controlled signal transmission right up to the contact tip and reduces losses as well as radiation effects compared with non-coaxial contact concepts. Individually sprung tips made of beryllium copper, tungsten, or nickel provide a secure electrical connection. The direct view of the contact tips simplifies precise positioning and supports a reproducible measurement setup.
Your Advantages at a Glance
Coaxial microwave probe tips for precise RF wafer probing Reproducible on-wafer measurements in development and characterization Stable signal transmission for comparable RF and microwave analyses Flexible integration into lab and wafer test environments Many designs and custom configurations available.
Alternative Products
If you need flexible RF measurements on small pads and hard-to-reach test points up to 11 GHz, we recommend the PICOPROBE® Model 10 Series with replaceable tips and adjustable ground configuration. If you want to measure sensitive IC signals with minimal loading, the active PICOPROBE® Model 12C is the better alternative, offering a 1 MΩ input resistance and 0.1 pF input capacitance up to 500 MHz.
Related Product Categories
Contact us for technical advice and further information.
We will be happy to support you in selecting the right microwave probe tip from the PICOPROBE® 40-110 Series for your measurement task.
Variants
Specifications
Cross-Model Specifications
| Coaxial microwave probe tips | for precise RF, microwave, and millimeter-wave wafer probing |
|---|---|
| Patented coaxial design | for controlled and stable signal transmission |
| Individually sprung contacts | for reliable on-wafer contacting |
| Reliable measurements | even on uneven (non-planar) wafer surfaces |
| Direct view of the contact tips | for precise positioning |
| Flexible integration | into manual and automated probe stations |
| Measurement principle | coaxial signal transmission up to the contact tip |
| Contact material | beryllium copper, optionally tungsten or nickel depending on model |
| Contact geometries | GSG, GS, SG |
| Application range | on-wafer measurements in RF, microwave, and millimeter-wave applications |
Model 40A
| Optimized for development and production measurements | with very high repeatability |
|---|---|
| Especially suitable | for automated wafer tests, probe cards, and multi-contact wedges |
| Optionally available | with tungsten or nickel contact tips |
| Very high flexibility | through custom adapters and holders |
| Frequency range | DC to 40 GHz |
| RF connector | 2.92 mm K connector (compatible with 3.5 mm / SMA) |
| Pitch (tip spacing) | 25 µm to 2540 µm |
| Measurement repeatability | very high (suitable for series production and manufacturing) |
Model 50A
| Designed for high-end RF and microwave measurements | with extended bandwidth |
|---|---|
| Focus on maximum signal integrity | at higher frequencies |
| Preferred for | demanding laboratory and characterization applications |
| Frequency range | DC to 50 GHz |
| RF connector | 2.4 mm connector (V-compatible) |
| Pitch (tip spacing) | available from 25 µm |
| Measurement repeatability | high |
Model 67A
| Designed for | advanced RF applications beyond conventional high-frequency ranges |
|---|---|
| Suitable for | on-wafer measurements in the millimeter-wave range |
| Primarily used | in advanced development and research environments |
| Frequency range | DC to 67 GHz |
| RF connector | 1.85 mm V connector (compatible with 2.4 mm) |
| Pitch (tip spacing) | 50 µm to 1250 µm |
| Measurement repeatability | high |
Model 110H
| Developed for | on-wafer measurements in the highest millimeter-wave frequency ranges |
|---|---|
| Used in | research, development, and high-end characterization |
| Suitable for | millimeter-wave ICs and W-band structures |
| Frequency range | DC to 110 GHz |
| RF connector | 1.0 mm connector |
| Pitch (tip spacing) | 50 µm to 1250 µm |
| Measurement repeatability | very high (mmWave-optimized) |
Options & Accessories
| Probe tip holders and adapters for standard microwave probe stations | |
| Mounting hardware for probe cards and multi-contact wedges | |
| Custom mechanical holders for special setups and confined installation situations | |
| Waveguide interfaces / waveguide adapters for applications in very high frequency ranges (depending on model) | |
| Optional integrated bias tee for measurements on active devices (available only for waveguide versions) |
Scope of Delivery
| PICOPROBE® 40-110 Series microwave probe in the ordered configuration |
Applications
Cross-Model Applications:
| RF wafer probing for active and passive components |
| On-wafer measurements in development, characterization, and research |
| S-parameter analyses and frequency-dependent RF measurement tasks |
| Measurements on wafers, substrates, and test structures |
| Use in manual and automated probe stations |
| Characterization of RF, microwave, and millimeter-wave devices |
| Reproducible measurements through coaxial probe tip design |
| Precise contacting even on uneven (non-planar) wafer surfaces |
Model-Specific Applications 50A:
| High-end RF and microwave measurements in the laboratory |
| Precise S-parameter measurements at higher frequencies |
| Characterization of RF ICs, MMICs, and passive RF structures |
| Validation and optimization of RF circuits and layouts |
| Research and development applications with high signal integrity requirements |
Model-Specific Applications 67A:
| Advanced RF applications beyond conventional RF and microwave ranges |
| On-wafer measurements in the millimeter-wave range |
| Characterization of modern RF ICs and MMICs with extended frequency requirements |
| Technology and platform development for future mmWave applications |
| Research-oriented measurement tasks in advanced development environments |
Model-Specific Applications 110H:
| On-wafer measurements in the highest millimeter-wave frequency ranges |
| Characterization of mmWave ICs, W-band, and sub-THz structures |
| Research and development applications in universities and industrial research |
| Validation of novel semiconductor technologies and device concepts |
| High-frequency device and material characterization |
Links & Downloads
Available Documents (Subject to Change)
Supplier
GGB Industries, der Erfinder der Picoprobe®-Produktlinie von Mikrowellen- und Oszilloskop-Tastköpfen, liefert bereits seit 1980 Messköpfe für On-wafer Messungen für die Halbleiterindustrie, beginnend mit einer Reihe hochohmiger Sonden für die Fehlersuche bei der Diagnose der internen Funktionsweise komplexer Logik- und Speicherchips. Seitdem hat GGB eine beeindruckende Anzahl an neuen, patentierten Lösungen entwickelt. Man kann also mit Fug und Recht behaupten, dass GGBs Stärken insbesondere handwerkliches Können, Präzision, Kundendienst und Problemlösung sind.
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