Agil eFuse2 | Electronic Fuse
Protects wafer probes, bias tees, and DUTs from overcurrent damage with ultra-fast shutdown – ideal for safe on-wafer and semiconductor testing.
- ✓ Electronic fuse for on-wafer test
- ✓ protection for wafer probes / bias tees / connectors and transistors
€2,100.00
% Regular price: €2,340.00 (10.26% saved)Prices plus VAT plus shipping costs
Electronic Fuse for On-Wafer Measurements
AGIL eFuse2-300-10: Overcurrent Protection for On-Wafer Testing of Power Semiconductors
During on-wafer measurements on power semiconductors such as FETs or HBTs, a slipped probe can cause a high current. Incorrect contacting can have the same effect. This can damage the DUT, bias tee, connectors, and wafer probe.
The AGIL eFuse2 monitors the current in the DC bias line and is connected in series between the DC power supply and the DUT. If the current exceeds the set current limit, the electronic fuse interrupts the current flow in less than 300 ns.
Set the Current Limit and Remote-Control the eFuse via RS-232
The current limit can be set using a rotary push knob or via the RS-232 interface. For currents above 1 A, the current-limit setting accuracy is 5%. The current measured by the eFuse can also be read via the interface. The accuracy of the reported current value is approximately 5%. This makes the value suitable for current monitoring, but not for precision measurements.
Related Product Categories
Power Supplies / Sources | ProbesWould you like to reliably protect your wafer probes and DUTs from overcurrent?
We can help you select and integrate the eFuse2 for safe on-wafer and semiconductor testing – tailored to your specific measurement application.
Specifications
| Product type | high-speed electronic fuse |
|---|---|
| DC input voltage | 0 to 300 VDC |
| Nominal current | 10 A DC |
| Current limit setting | 0 to 10 A DC |
| Turn-Off time | < 300 ns |
| Internal resistance | 50 mΩ |
| Voltage drop | 500 mVDC at 10 A |
| Temperature coefficient | 0.03 %/K |
| AC Mains voltage | 98 to 127 VAC or 207 to 253 VAC, depending on device version |
| Mains frequency | 47 to 63 Hz |
| Operation | display, status indicator and rotary push knob |
| Interface | RS-232 |
| Connections | safety sockets for input and output |
| Short-circuit immunity | continuous at 0 to 40 °C |
| Ambient temperature | 0 to 40 °C 0 bis 40 °C |
Options & Accessories
| AC mains voltage version | 98 to 127 VAC or 207 to 253 VAC, factory-set to one voltage range |
|---|
Scope of Delivery
| eFuse 2 100-10 electronic fuse | |
|---|---|
| AC power cord | |
| Operating manual |
Applications
| Fast current shut-off | protection of DUTs against excessive current |
|---|---|
| Probe protection | reduced risk of damage caused by high stored energy |
| Protection with laboratory power supplies | limiting energy from the power supply output capacitors |
| Research and development | use in research laboratories of semiconductor manufacturers and universities |
| DC test setups | protection device upstream of power supplies for applications up to 100 VDC and 10 A |
Links & Downloads
Supplier
AGIL stands for Analog and Switched Industrial Power Electronics. The name of this small German specialist in custom power supply solutions says it all. bsw is the exclusive distributor of the efuse product family. The efuse is not a fuse in the conventional sense, but rather a high-speed electronic circuit that can disconnect the test probes used in on-wafer or semiconductor testing faster than a short circuit can damage the test probe and the device under test.