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Product Information "Electronic High-Speed DC Load | IT8700P+ Series"
ITECH IT8700P+
Electronic High-Speed Multi-Channel DC Load
Ultra-Fast Dynamics up to 12 A/µs, Flexible Power Scaling via 16-Channel Master/Slave Parallel Operation
System Architecture and Operating Principle
The IT8700P+ series is a multi-channel DC electronic load with high-speed control, designed as a modular test system.
The DC load system consists of a mainframe and plug-in load modules that are synchronously controlled.
IT8700P+ modules are compatible with existing IT8700P systems and can be operated together within the same chassis.
The architecture supports master-slave parallel operation and enables simultaneous testing of multiple outputs or
multi-output DC power supplies.
Dynamic Load Simulation and Control Performance
This electronic DC load is designed for test applications requiring fast load transients and stable control behavior.
The high control speed allows controlled current loading without overshoot and supports reproducible results in dynamic tests.
Multiple current ranges enable precise load simulation in both low-current and high-current operating regions,
making the DC load suitable for functional, efficiency, and standby testing.
Applications in Development, Production, and Quality Assurance
Typical applications of the IT8700P+ include testing of batteries, supercapacitors, fuel cells, as well as AC-DC and
DC-DC power supplies. Power supplies with multiple outputs can also be tested synchronously using the multi-channel DC load.
With integrated communication interfaces and support for the SCPI protocol, the system is well suited for automated
test systems, end-of-line testing, and structured quality assurance in industrial environments.
Safety, Protection Functions, and System Integration
Comprehensive protection functions support safe operation in daily test environments.
The modular system structure simplifies integration of the DC electronic load into existing test setups and provides
high investment protection through flexible expandability as test requirements grow.
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Use a powerful DC load system for precise testing tasks in development and manufacturing.
Contact us for expert consultation on the IT8700P+ series and for support with integrating this electronic DC load into your test system.
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Specifications of the IT8700P+ Series
- Three-stage current range for higher accuracy and lower ripple
- Supports master-slave parallel operation of up to 16-channel modules, enabling flexible power expansion
- Faster dynamic response; the current rise and fall rate of a single module can reach 12 A/μs
- Stable operation down to 0 V; suitable for low-voltage capacitors, solar cells, fuel cells, and other low-voltage high-current power supplies
- Higher loop speed enables precise current control without overshoot
- Voltage and current measurement speed increased to 250 kHz, beneficial for system integration
- Comprehensive protection functions: OVP, OCP, OPP, OTP, touch protection; compatible with IT8700P mainframes, allowing mixed operation of legacy and new modules
- Short-circuit peak current measurement function
- Front and rear terminals available (current is limited to 15 A when using front terminals)
- Eight operating modes: CC, CV, CR, CW, CV+CC, CR+CC, CW+CC, CV+CR (CR-LED)
- Automatic test function to determine whether test results exceed predefined specifications
- Built-in LAN, USB, and RS232 interfaces
- Adjustable CV loop speed to match different devices under test
- Multi-channel synchronous control
Options of the IT8700P+ Series
- Expansion chassis communication cable for IT8703P
- IT-E9005: ITECH Warranty up to 5 years
- IT-E9003: ITECH Warranty up to 3 years
Scope of Delivery of the IT8700P+ Series
- Unit(s) of the IT8700P+ Series
Video of the IT8700P+ Series
Application Examples of the IT8700P+ Series
- System integration in automated test environments
- Testing of supercapacitors, fuel cells, lithium-ion batteries, as well as high-speed AC-DC and DC-DC power supplies, such as computer and communication power supplies
- Research and development applications
- Use in production lines and manufacturing test setups