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Dynamic DC Load Testing for Power Supplies and Modular Test Systems

ITECH IT8700P+: High Dynamic Performance for Development and System Integration

The ITECH IT8700P+ Series is a modular electronic multi-channel DC load with high dynamic performance for development, production, and system integration. Synchronously controlled load channels enable defined testing of single or multiple DC outputs and are particularly suitable for repeatable dynamic load testing.

With current rise and fall rates of up to 12 A/µs, the IT8700P+ generates fast load transients. This allows the transient response of power supplies under changing load conditions to be evaluated. Fast control response supports controlled current loading with low overshoot.

The low on-resistance enables load testing at very low input voltages down to near 0 V. For larger test setups, master-slave operation allows the system to be expanded to up to 16 channels and 4.8 kW of load power without reducing dynamic performance.

Programmable test sequences, synchronous multi-channel control, and SCPI-based system integration support use in automated test systems. Detailed operating modes, measurement functions, interfaces, and protection functions are listed in the technical specifications.

Alternative Products

For modular multi-channel DC load testing with lower requirements for dynamic performance and measurement speed, the ITECH IT8700 multi-channel DC load is a suitable alternative. For programmable multi-channel DC load testing up to 500 V, the ITECH IT8700P programmable multi-channel DC load is available.

Related Product Categories

Electronic Loads

Configure The Right DC Load For Your Test Setup

Testing load transients, multiple DC outputs, or low-voltage high-current DUTs? We help define channel count, load current, slew rate, power range, and interfaces for your IT8700P+ configuration.

Specifications

Device class programmable high-speed multi-channel DC electronic load
Voltage levels 150 V and 600 V, depending on model
Load current up to 120 A per module, depending on model
Power up to 600 W per module; master-slave parallel operation with up to 8 units, 16 channels, and 4.8 kW
Dynamic performance current rise and fall rates up to 12 A/µs per module; dynamic operation from 0.001 Hz to 20 kHz
Measurement voltage and current measurement up to 250 kHz; three current ranges for precise measurement at low and high load currents
Low-voltage operation very low on-resistance and stable operation down to near 0 V
Operating modes CC, CV, CR, CW, CV+CC, CR+CC, CW+CC, and CV+CR/CR-LED
Multi-channel operation synchronous control of multiple load channels; IT8700P and IT8700P+ modules can be combined within the same system
Test functions Auto Test as well as Continuous, Pulse, and Toggle modes for dynamic testing
Interfaces and protocol
  • LAN, USB, and RS232
  • SCPI
  • GPIB (G models)
Protection functions OVP, OCP, OPP, OTP, and Sense protection

Options & Accessories

IT-E9003 ITECH warranty extension up to 3 years
IT-E9005 ITECH warranty extension up to 5 years
Communication cable 60 cm DB25 connection cable for the IT8703P expansion chassis

Scope of Delivery

IT8700P+ Series unit(s)
AC power cord
USB communication cable

Applications

Dynamic load testing of AC/DC power supplies and DC/DC converters
Low-voltage, high-current testing of fuel cells, supercapacitors, and solar cells
Battery and energy storage testing
Testing of computer and communications power supplies
System integration into test benches and production lines

Videos

Links & Downloads

Available Documents (Subject to Change)

Supplier

LXinstruments has been supplying ITECH equipment since 2020. When an individual instrument needs to become part of a complete test system, we support you with product selection, system sizing and integration into the automation environment. The key is to ensure that the DUT, power requirements, interfaces and test sequence work together.

We also use ITECH equipment in customized test systems. Depending on the test application, we combine power supplies, electronic loads, grid simulation and measurement technology so that the functions match both the DUT and the test sequence.

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