PICOPROBE® Models 12C | Active Hi-Z Probe
Measures high-speed IC nodes precisely with minimal loading – ideal for sensitive on-wafer and micro-probing.
- ✓ Active Hi-Z Probe for IC Measurements
- ✓ 1 MΩ/0.1 pF Input
- ✓ 0.8 ns
- ✓ DC to 500 MHz
- ✓ 10:1/20:1 Attenuation
Active Hi-Z Probe with 0.1 pF Input Capacitance and 500 MHz Bandwidth
Measure Fast IC Nodes with Low Probe Loading
The GGB Industries PICOPROBE® Model 12C is a fast, active high-impedance probe for measurements on internal IC nodes. The combination of 1 MΩ input resistance and 0.1 pF input capacitance keeps the loading on sensitive measurement points low. With full DC capability, 500 MHz bandwidth and 0.8 ns rise/fall time, the Model 12C is suitable for fast measurements in bipolar, NMOS and CMOS circuits, as well as capacitively critical IC nodes.
Defined Attenuation for Hi-Z and 50 Ω Measurements
The PICOPROBE® Model 12C can be used with high-impedance oscilloscope inputs and with 50 Ω inputs. Signal attenuation is 10:1 at a high-impedance input and 20:1 at a 50 Ω input. For coaxial RF or microwave contacting instead of high-impedance IC node measurement, you can find suitable alternatives in the probes / probe tips category.
Replaceable Probe Tips for Demanding Micro-Contacting
The probe tips include a precision resistor/capacitor combination and a finely tapered tungsten probing wire. Probe tips are available with 10 µm to 125 µm wire diameters. The corresponding tip diameters range from < 0.2 µm to < 5.0 µm. The bend-elastic tungsten wire supports contact at the probing point and reduces the risk of mechanical damage to the probe tip and IC structure.
Alternative Products
If your measurement does not require high-impedance IC node probing but instead requires coaxial RF contacting with replaceable probe tips, the PICOPROBE® Model 10 Series is the suitable alternative to the PICOPROBE® Model 12C.
Send us the details of your probe station, micropositioner and measurement task. Our experts will recommend the right configuration.
Related Product Categories
Select the Right PICOPROBE® Model 12C for Your Test Setup
Selecting the right PICOPROBE® Model 12C requires experience with probe stations, micropositioners and the contacting sensitive IC structures. Depending on the test setup and contacting task, the probe tip housing shape, tip geometry and wire diameter may vary. We support you in this selection process and check which Model 12C configuration is technically suited to your application.
Specifications
| Input impedance | 1 MΩ in parallel with 0.1 pF |
|---|---|
| Rise/fall time | 0.8 ns |
| Bandwidth | DC to 500 MHz |
| Linearity | 0.5% |
| Voltage range | −10 to +20 V |
| Gain accuracy | ±3% |
| Signal attenuation | 1 into a 50 Ω input |
| Supply voltage | 110 V or 230 V |
Options & Accessories
Probe tip housing shapes
| Model 12C-1 | straight shape |
|---|---|
| Model 12C-2 | angled shape |
| Model 12C-4 | extended straight shape |
Replacable probe tips - order variants by shape, tungsten wire diameter, and tip diameter
| 12C-1-10 | 10 µm wire shaft diameter, tip diameter < 0.2 µm |
|---|---|
| 12C-1-22 | 22 µm wire shaft diameter, tip diameter < 1.0 µm |
| 12C-1-35 | 35 µm wire shaft diameter, tip diameter < 2.0 µm |
| 12C-1-60 | 60 µm wire shaft diameter, tip diameter < 3.0 µm |
| 12C-1-125 | 125 µm wire shaft diameter, tip diameter < 5.0 µm |
| 12C-2-10 | 10 µm wire shaft diameter, tip diameter < 0.2 µm |
| 12C-2-22 | 22 µm wire shaft diameter, tip diameter < 1.0 µm |
| 12C-2-35 | 35 µm wire shaft diameter, tip diameter < 2.0 µm |
| 12C-2-60 | 60 µm wire shaft diameter, tip diameter < 3.0 µm |
| 12C-2-125 | 125 µm wire shaft diameter, tip diameter < 5.0 µm |
| 12C-4-10 | 10 µm wire shaft diameter, tip diameter < 0.2 µm |
| 12C-4-22 | 22 µm wire shaft diameter, tip diameter < 1.0 µm |
| 12C-4-35 | 35 µm wire shaft diameter, tip diameter < 2.0 µm |
| 12C-4-60 | 60 µm wire shaft diameter, tip diameter < 3.0 µm |
| 12C-4-125 | 125 µm wire shaft diameter, tip diameter < 5.0 µm |
PICOPROBE® Standard-Power Supply
| 110 V | |
| I230 V |
Note: The suitable probe tip shape and tungsten wire diameter depend on your probe station, wafer probing setup, and micropositioner. Please contact us — we will be happy to help you find the optimal configuration for your application.
Scope of Delivery
| PICOPROBE® Model 12C, probe tip with tungsten wire — depending on configuration |
| Power supply — depending on configuration |
Applications
| Measurement of internal node voltages in integrated circuits |
| Troubleshooting of high-speed bipolar, NMOS, and CMOS circuits |
| Measurements on dynamic nodes with short hold times |
| On-wafer probing in semiconductor technology |
Links & Downloads
Available Documents (Subject to Change)
Supplier
GGB Industries, der Erfinder der Picoprobe®-Produktlinie von Mikrowellen- und Oszilloskop-Tastköpfen, liefert bereits seit 1980 Messköpfe für On-wafer Messungen für die Halbleiterindustrie, beginnend mit einer Reihe hochohmiger Sonden für die Fehlersuche bei der Diagnose der internen Funktionsweise komplexer Logik- und Speicherchips. Seitdem hat GGB eine beeindruckende Anzahl an neuen, patentierten Lösungen entwickelt. Man kann also mit Fug und Recht behaupten, dass GGBs Stärken insbesondere handwerkliches Können, Präzision, Kundendienst und Problemlösung sind.
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