PICOPROBE 40-110 | Microwave Probes
Precise, repeatable on-wafer RF measurements up to 110 GHz thanks to the coaxial design and reliable contact.
- ✓ High-Performance Microwave Probes for HF Measurements
- ✓ from DC 40 to 110 GHz
- ✓ Coaxial Design
- ✓ Spring-Loaded Contacts
Prices plus VAT plus shipping costs
Microwave Probes for RF Wafer Probing and On-Wafer Measurements
PICOPROBE 40-110: Coaxial Microwave Probes for Precise On-Wafer Measurements
The PICOPROBE 40-110 Series from GGB Industries comprises high-precision coaxial microwave probes designed for demanding RF wafer probing and reliable on-wafer measurements.
Applications range from RF and microwave to millimeter-wave measurement technology.
Precise electrical contacting of wafers and substrates provides the basis for stable and comparable measurement results, particularly for S-parameter analysis and other RF measurement tasks.
Coaxial Design for Reproducible On-Wafer Measurements
The patented coaxial design ensures controlled signal transmission to the probe tip and reduces losses and radiation effects compared with non-coaxial contacting concepts.
Individually spring-loaded tips made of beryllium copper, tungsten, or nickel provide reliable electrical contact. Direct visibility of the probe tips facilitates precise positioning and supports a reproducible measurement setup.
Your Benefits at a Glance:
- coaxial microwave probes for precise RF wafer probing
- reproducible on-wafer measurements for development and characterization
- stable signal transmission for comparable RF and microwave analysis
- flexible integration into laboratory and wafer test environments
- wide range of configurations and custom solutions available
Flexible Integration Into Laboratory and Wafer Test Environments
The PICOPROBE 40-110 Series is suitable for both manual laboratory setups and automated wafer test systems. Integration into existing probe stations is straightforward, and common contact configurations for direct on-wafer measurements are reliably supported.
Alternative Products:
For flexible RF measurements on small pads and hard-to-reach test points up to 11 GHz, we recommend the PICOPROBE® Model 10 Series with replaceable tips and variable ground configurations. For high-impedance, low-loading measurements of sensitive IC signals, the active PICOPROBE® Model 12C with 1 MΩ input resistance and 0.1 pF input capacitance up to 500 MHz is the more suitable alternative.
Related Product Categories:
Probes
Contact us for technical advice and further information.
We will be happy to support you in selecting the right microwave probe tip from the PICOPROBE® 40-110 Series for your measurement task.
Variants
Specifications
Cross-Model Specifications
| Coaxial microwave probe tips | for precise RF, microwave, and millimeter-wave wafer probing |
|---|---|
| Patented coaxial design | for controlled and stable signal transmission |
| Individually sprung contacts | for reliable on-wafer contacting |
| Reliable measurements | even on uneven (non-planar) wafer surfaces |
| Direct view of the contact tips | for precise positioning |
| Flexible integration | into manual and automated probe stations |
| Measurement principle | coaxial signal transmission up to the contact tip |
| Contact material | beryllium copper, optionally tungsten or nickel depending on model |
| Contact geometries | GSG, GS, SG |
| Application range | on-wafer measurements in RF, microwave, and millimeter-wave applications |
Model 40A
| Optimized for development and production measurements | with very high repeatability |
|---|---|
| Especially suitable | for automated wafer tests, probe cards, and multi-contact wedges |
| Optionally available | with tungsten or nickel contact tips |
| Very high flexibility | through custom adapters and holders |
| Frequency range | DC to 40 GHz |
| RF connector | 2.92 mm K connector (compatible with 3.5 mm / SMA) |
| Pitch (tip spacing) | 25 µm to 2540 µm |
| Measurement repeatability | very high (suitable for series production and manufacturing) |
Model 50A
| Designed for high-end RF and microwave measurements | with extended bandwidth |
|---|---|
| Focus on maximum signal integrity | at higher frequencies |
| Preferred for | demanding laboratory and characterization applications |
| Frequency range | DC to 50 GHz |
| RF connector | 2.4 mm connector (V-compatible) |
| Pitch (tip spacing) | available from 25 µm |
| Measurement repeatability | high |
Model 67A
| Designed for | advanced RF applications beyond conventional high-frequency ranges |
|---|---|
| Suitable for | on-wafer measurements in the millimeter-wave range |
| Primarily used | in advanced development and research environments |
| Frequency range | DC to 67 GHz |
| RF connector | 1.85 mm V connector (compatible with 2.4 mm) |
| Pitch (tip spacing) | 50 µm to 1250 µm |
| Measurement repeatability | high |
Model 110H
| Developed for | on-wafer measurements in the highest millimeter-wave frequency ranges |
|---|---|
| Used in | research, development, and high-end characterization |
| Suitable for | millimeter-wave ICs and W-band structures |
| Frequency range | DC to 110 GHz |
| RF connector | 1.0 mm connector |
| Pitch (tip spacing) | 50 µm to 1250 µm |
| Measurement repeatability | very high (mmWave-optimized) |
Options & Accessories
| Probe tip holders and adapters for standard microwave probe stations | |
| Mounting hardware for probe cards and multi-contact wedges | |
| Custom mechanical holders for special setups and confined installation situations | |
| Waveguide interfaces / waveguide adapters for applications in very high frequency ranges (depending on model) | |
| Optional integrated bias tee for measurements on active devices (available only for waveguide versions) |
Scope of Delivery
| PICOPROBE® 40-110 Series microwave probe in the ordered configuration |
Applications
Cross-Model Applications:
| RF wafer probing for active and passive components |
| On-wafer measurements in development, characterization, and research |
| S-parameter analyses and frequency-dependent RF measurement tasks |
| Measurements on wafers, substrates, and test structures |
| Use in manual and automated probe stations |
| Characterization of RF, microwave, and millimeter-wave devices |
| Reproducible measurements through coaxial probe tip design |
| Precise contacting even on uneven (non-planar) wafer surfaces |
Model-Specific Applications 50A:
| High-end RF and microwave measurements in the laboratory |
| Precise S-parameter measurements at higher frequencies |
| Characterization of RF ICs, MMICs, and passive RF structures |
| Validation and optimization of RF circuits and layouts |
| Research and development applications with high signal integrity requirements |
Model-Specific Applications 67A:
| Advanced RF applications beyond conventional RF and microwave ranges |
| On-wafer measurements in the millimeter-wave range |
| Characterization of modern RF ICs and MMICs with extended frequency requirements |
| Technology and platform development for future mmWave applications |
| Research-oriented measurement tasks in advanced development environments |
Model-Specific Applications 110H:
| On-wafer measurements in the highest millimeter-wave frequency ranges |
| Characterization of mmWave ICs, W-band, and sub-THz structures |
| Research and development applications in universities and industrial research |
| Validation of novel semiconductor technologies and device concepts |
| High-frequency device and material characterization |
Links & Downloads
Available Documents (Subject to Change)
Supplier
GGB Industries, the inventor of the Picoprobe® line of microwave and oscilloscope probes, has been supplying probes for on-wafer measurements to the semiconductor industry since 1980, starting with a series of high-impedance probes for troubleshooting and diagnosing the internal operation of complex logic and memory chips. Since then, GGB has developed an impressive number of new, patented solutions. It is therefore fair to say that GGB’s strengths lie particularly in craftsmanship, precision, customer service, and problem-solving.