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GGB PICOPROBE® 18C/19C – Active High-Impedance Probes for MOS Nodes and On-Wafer Probing

GGB PICOPROBE® Models 18C/19C: Active Probes for High-Impedance MOS Nodes

The GGB PICOPROBE® Models 18C/19C are active high-impedance probes for direct measurements on MOS nodes, fine conductor structures and wafer-probing setups. With 0.04 pF input capacitance and 10 fA input leakage, the input places only a small load on the contact point. The signal is routed to the oscilloscope while keeping the loading at the measurement point lower than with a standard passive probe.

Connecting the Measurement Point to the Oscilloscope Input

At high-impedance nodes, the input load determines how much the probe changes the measurement point. The 18C/19C models route the signal from the contact point to the oscilloscope and keep the capacitive load at the input low.

Voltage Ranges, Attenuation and the Probes Category of the GGB PICOPROBE® Models 18C and 19C

GGB specifies a signal path from DC to 350 MHz. Model 18C covers 0 to +10 V, while Model 19C covers -7 to +3 V. At the oscilloscope, GGB specifies 10:1 attenuation at high-impedance inputs and 20:1 at 50-Ω inputs.

Selecting the Probe Tip by Contact Area and Wire Diameter

For replacement tips, the contact area determines which tungsten-wire diameter fits the measurement point. GGB lists 5 µm, 10 µm, 20 µm and 50 µm wire diameters; smaller diameters suit very small structures, while larger diameters provide more mechanical margin during touchdown.

Alternative Products

For RF or microwave probing rather than high-impedance MOS nodes, the LXinstruments shop lists the PICOPROBE® Model 10 Series as a separate product line.

For measurement tasks focused on capacitance or resistance, the PICOPROBE® Models 7/7A are the appropriate alternative.

Related Product Categories

Probes

Clarify Your Measurement Task

Are you measuring sensitive MOS nodes and need to check model selection, voltage range or oscilloscope input before sending an enquiry? Send us your measurement task and the key setup details. Our expert team will be happy to help.

Specifications

Shared Specifications of Models 18C and 19C

Input capacitance 0.02 pF
Input leakage 10⁻¹⁴ A
Rise/fall time 1.2 ns
Frequency response DC to 350 MHz
Gain accuracy ±5 %
Signal attenuation 10 to 1 with high-input-impedance oscilloscopes, 20 to 1 with 50-ohm input

Model 18C

Operating range 0 to +10 V
Linearity 0.2% in the 5 V range, 2% in the 10 V range

Model 19C

Operating range -7 to +3 V
Linearity 0.2% in the ±3 V range, 2% in the -7 to +3 V range

Options & Accessories

Probe tip housing shapes:

Model 18C-1 straight shape
Model 18C-2 angled shape
Model 18C-4 extended straight shape

Replaceable probe tips - ordering variants based on housing shape, tungsten wire diameter, and point diameter:

18C-1-10 wire diameter 10 µm, point diameter < 0.1 µm
18C-1-20 wire diameter 20 µm, point diameter < 1.0 µm
18C-1-50 wire diameter 50 µm, point diameter < 3.0 µm
18C-2-10 wire diameter 10 µm, point diameter < 0.1 µm
18C-2-20 wire diameter 20 µm, point diameter < 1.0 µm
18C-2-50 wire diameter 50 µm, point diameter < 3.0 µm
18C-4-10 wire diameter 10 µm, point diameter < 0.1 µm
18C-4-20 wire diameter 20 µm, point diameter < 1.0 µm
18C-4-50 wire diameter 50 µm, point diameter < 3.0 µm

PICOPROBE® Standard-Power Supply:

110 V
230 V

Note: The suitable probe tip housing shape and tungsten wire diameter depend on your probe station, wafer test setup, and micropositioner. Please contact us – we will be happy to help you find the optimum version for your application.

Scope of Delivery

PICOPROBE® Model 18C or PICOPROBE® Model 19C, probe tip with tungsten wire – depending on configuration
Power supply – depending on configuration

Applications

Direct probing of sensitive MOS dynamic nodes
Characterization of fast circuits from DC to 350 MHz
Measurements on finest conductor lines and microstructures
Use on probe stations and micropositioners
On-wafer probing in semiconductor technology

Supplier

GGB Industries, der Erfinder der Picoprobe®-Produktlinie von Mikrowellen- und Oszilloskop-Tastköpfen, liefert bereits seit 1980 Messköpfe für On-wafer Messungen für die Halbleiterindustrie, beginnend mit einer Reihe hochohmiger Sonden für die Fehlersuche bei der Diagnose der internen Funktionsweise komplexer Logik- und Speicherchips. Seitdem hat GGB eine beeindruckende Anzahl an neuen, patentierten Lösungen entwickelt. Man kann also mit Fug und Recht behaupten, dass GGBs Stärken insbesondere handwerkliches Können, Präzision, Kundendienst und Problemlösung sind.

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