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Coaxial Passive RF and Microwave Probes for 50 Ω and High-Impedance Test Points, up to 11 GHz

Passive RF and Microwave Probe for Precise Contacting up to 11 GHz

The Picoprobe Model 10 Series from GGB Industries is a passive high-speed probing system for RF and microwave measurements on printed circuit boards, wafer structures, RF modules, ICs, and prototypes. The basic system combines a flexible 50 Ω coaxial cable with a length of 1 m, SMA connector, and interchangeable coaxial probe tips. Depending on the version, the Model 10 Series can acquire or inject high-frequency signals and can be used at 50 Ω test points as well as at high-impedance test points. Selection is based on input resistance, attenuation, contact length, ground configuration, wire diameter, contact material and spacing between the probe contacts. Depending on the probe tip configuration, the maximum frequency range extends from DC to 11 GHz.

High-Impedance Test Points with Defined Signal Attenuation

For high-impedance test points GGB offers Model 10 Series probes with 250 Ω, 500 Ω or 5 kΩ input resistance. Depending on the input resistance, these versions attenuate the acquired signal at a ratio of 5:1, 10:1 or 100:1. For 50 Ω environments, the Model 10 Series includes versions with a 50 Ω terminating resistor for measuring and injecting high-frequency signals.

Ground Configuration and Signal Quality

Why Is Ground Configuration So Important with the Picoprobe Model 10 Series? In RF and microwave measurements the contact geometry directly affects signal quality. Short signal paths and a short ground connection reduce unwanted inductance, reflections, and signal distortion. If a suitable ground point is located directly next to the signal point, the Model 10 Series routes signal and ground through two separate probe contacts. If the ground point is farther away, a flexible ground strap can replace the ground contact. This simplifies measurement series with many contact points and test setups where no local ground point is available. GGB offers ground configuration options ranging from separate signal and ground contacts to a flexible 6-inch ground strap. According to the manufacturer, the Model 10 probe tips are matched to the flexible 50 Ω coaxial cable supplied as standard equipment. This compensates for cable attenuation. At the same time, the measurement setup becomes less sensitive to a greater distance from the ground point.

Fine-Pitch Contacting on Small Pads and Wafer Structures

The interchangeable Model 10 probe tips allow precise adaptation of the contacting to the measurement point. Available options include probe wire diameters between 125 µm and 10 µm, contact materials made of tungsten, palladium, or beryllium copper and - for tungsten - tip radii down to approximately 0.2 µm. The version can be selected with one signal contact or with separate signal and ground contacts. In addition, ground position and spacing between signal and ground contact can be defined. This makes the Model 10 Series suitable for small pads, dense RF assemblies, PCB traces and wafer structures, where electrical characteristics and contact geometry must be matched.

Which Probe Tip Fits Your Measurement Task?

The input resistance determines how much the measurement loads the test point. The attenuation defines which signal level reaches the measuring instrument. Wire diameter, contact material, and contact spacing determine how reliably small pads, PCB traces, or wafer structures can be contacted. Would you like to make sure that the selected Picoprobe Model 10 probe tip fits your application? Additional RF and microwave probes for precise contacting and reliable measurement results can be found here. Or even easier: Send us your inquiry. We support you in selecting the right version and help classify the probe tip according to your test setup - straightforward, application-oriented, and without unnecessary coordination on your part.

Specifications

Specification Value
Frequency range Depending on the probe tip version, DC to 11 GHz
System setup Flexible 50 Ω coaxial cable with 1 m length, SMA connector, and interchangeable coaxial probe tips
Mounting Suitable for micropositioners and probing systems
Input variants 50 Ω, 250 Ω, 500 Ω, 1 kΩ, 2.5 kΩ, and 5 kΩ; optional 50 Ω termination resistor
Attenuation 1 to 1, 5 to 1, 10 to 1, 20 to 1, 50 to 1, or 100 to 1 depending on the version
Probe wire materials Tungsten, palladium, or beryllium copper
Probe wire diameter 125 µm, 60 µm, 35 µm, 22 µm, or 10 µm
Probe tip design flexible 50 Ω coaxial cable with a length of 0.38 m, mounting nut, one or two probe contacts
Contact configuration One signal contact or separate signal and ground contacts
Grounding Dual probe contact or flexible ground strap up to 6 inches, depending on frequency range and test setup
50 Ω input impedance
Frequency range DC to 3.5 GHz (0.120 inch probe wire length)
Frequency range DC to 7 GHz (0.030 inch probe wire length)
Insertion loss 3 dB
Return loss > 10 dB
Attenuation 1 to 1
250 Ω input impedance
Frequency range DC to 10 GHz (-3 dB)
Attenuation 5 to 1
500 Ω input impedance
Frequency range DC to 11 GHz (-3 dB)
Attenuation 1
5 kΩ input impedance
Frequency range 100 to 1

Options & Accessories

Manufacturer number Name
Input variants 50 Ω, 250 Ω, 500 Ω, 1 kΩ, 2.5 kΩ, and 5 kΩ
Termination resistor 50 Ω
Number of contacts One signal contact or separate signal and ground contacts
Probe wire material Tungsten, palladium, or beryllium copper
Probe wire diameter 125 µm, 60 µm, 35 µm, 22 µm, or 10 µm
Ground position Right or left of the signal point

Scope of Delivery

Scope of delivery
Model 10 Series probe head in the ordered version
Probe tip in the ordered version
Coaxial cable in the ordered version

Applications

Application examples
Signal use Acquire or inject signals
50 Ω test points Contacting of 50 Ω test points with signal and ground contact
High-impedance test points Measurements with 250 Ω, 500 Ω, or 5 kΩ input resistance
Frequency range RF measurements depending on the probe tip, from DC up to a maximum of 11 GHz
Mounting Use on micropositioners and in probing systems
Grounding Contacting via signal/ground contact or flexible ground strap
Signal injection Injection into high-impedance test points with 50 Ω termination resistor
Fine contacting Contacting of small structures with probe wire diameters from 125 µm to 10 µm

Supplier

GGB Industries, der Erfinder der Picoprobe®-Produktlinie von Mikrowellen- und Oszilloskop-Tastköpfen, liefert bereits seit 1980 Messköpfe für On-wafer Messungen für die Halbleiterindustrie, beginnend mit einer Reihe hochohmiger Sonden für die Fehlersuche bei der Diagnose der internen Funktionsweise komplexer Logik- und Speicherchips. Seitdem hat GGB eine beeindruckende Anzahl an neuen, patentierten Lösungen entwickelt. Man kann also mit Fug und Recht behaupten, dass GGBs Stärken insbesondere handwerkliches Können, Präzision, Kundendienst und Problemlösung sind.

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